Electro-thermal resonance in MOSFET devices

Citation
L. Codecasa et al., Electro-thermal resonance in MOSFET devices, ELECTR LETT, 37(1), 2001, pp. 57-58
Citations number
3
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
37
Issue
1
Year of publication
2001
Pages
57 - 58
Database
ISI
SICI code
0013-5194(20010104)37:1<57:ERIMD>2.0.ZU;2-I
Abstract
Previously presented work on electro-thermal interaction in silicon devices is extended. It is shown that an electro-thermal resonance oscillation can be induced in a MOSFET device, allowing an easy evaluation of thermal para meters.