Adjustment of dielectric properties of glass ceramic crystallization

Citation
M. Eberstein et al., Adjustment of dielectric properties of glass ceramic crystallization, GL SCI T-GL, 73, 2000, pp. 370-373
Citations number
4
Categorie Soggetti
Material Science & Engineering
Journal title
GLASS SCIENCE AND TECHNOLOGY-GLASTECHNISCHE BERICHTE
ISSN journal
09467475 → ACNP
Volume
73
Year of publication
2000
Supplement
C1
Pages
370 - 373
Database
ISI
SICI code
0946-7475(2000)73:<370:AODPOG>2.0.ZU;2-5
Abstract
Miniaturization and micro integration play an important role in communicati on technologies. For higher degrees of integration in microwave application s new dielectric materials with sintering temperatures below 900 degreesC, variable dielectric permittivities epsilon (r) > 20 and low dielectric loss es tan delta < 2.10(-3) are required. A glass ceramic composite that unites these properties is introduced. Mathematical prediction and the possibilit y of fine tuning of the resulting properties are given. Parameters for this are the choice of initial composition of the glass and the ceramic compone nt and the sintering temperature.