A microwave frequency reference based on VCSEL-driven dark line resonancesin Cs vapor

Authors
Kitching, J Knappe, S Vukicevic, N Hollberg, L Wynands, R Weidmann, W
Citation
J. Kitching et al., A microwave frequency reference based on VCSEL-driven dark line resonancesin Cs vapor, IEEE INSTR, 49(6), 2000, pp. 1313-1317
Citations number
31
Categorie Soggetti
Instrumentation & Measurement
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
ISSN journal
00189456 → ACNP
Volume
49
Issue
6
Year of publication
2000
Pages
1313 - 1317
Database
ISI
SICI code
0018-9456(200012)49:6<1313:AMFRBO>2.0.ZU;2-E
Abstract
Dark line resonances, narrowed with a buffer gas to less than 100 Hz width, are observed in a Cs vapor cell using a directly modulated vertical-cavity surface-emitting laser (VCSEL). An external oscillator locked to one of th ese resonances exhibits a short-term stability of sigma (y)(tau) = 9.3 x 10 -12/root tau, Which drops to 1.6 x 10(-12) at 100 s, A physics package for a frequency-reference based on this design could be compact, low-power, and simple to implement.