High-resolution high energy X-ray diffraction studies of charge ordering in CMR manganites and nickelates

Citation
Sb. Wilkins et al., High-resolution high energy X-ray diffraction studies of charge ordering in CMR manganites and nickelates, INT J MOD B, 14(29-31), 2000, pp. 3753-3758
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
INTERNATIONAL JOURNAL OF MODERN PHYSICS B
ISSN journal
02179792 → ACNP
Volume
14
Issue
29-31
Year of publication
2000
Pages
3753 - 3758
Database
ISI
SICI code
0217-9792(200012)14:29-31<3753:HHEXDS>2.0.ZU;2-M
Abstract
High-resolution, high-energy, X-ray diffraction results are presented for t he study of weak charge ordering phenomenon. By utilizing X-rays in the 100 keV region the dramatic increase in the penetration depth allows for both bulk-sensitive and high- resolution measurements to be made. The strontium doped La2NiO4 system is a prototypical system in the understanding of stron g electron-phonon coupling, and the resultant effects on material propertie s. At doping levels of 1/3 and (1)/(2) commensurate charge modulations are observed indicating real-space charge stripes. We have measured the correla tion lengths of these charge stripes using both 100 keV X-rays and 8.3 keV X-rays. In comparing our results we have observed that the charge stripes a ppear to be well correlated in the near-surface region with correlation len gths xi approximate to 2400 Angstrom. However, our bulk sensitive measureme nts show that the charge stripes appear in a possible stripe glass phase wi th a correlation length of only xi approximate to 300 Angstrom. Our measure ments on the 3D charge order manganite system Nd0.5Sr0.5MnO3 show that the charge ordering appears to be well correlated in the bulk of the sample in contrast to our nickelate results.