Sb. Wilkins et al., High-resolution high energy X-ray diffraction studies of charge ordering in CMR manganites and nickelates, INT J MOD B, 14(29-31), 2000, pp. 3753-3758
High-resolution, high-energy, X-ray diffraction results are presented for t
he study of weak charge ordering phenomenon. By utilizing X-rays in the 100
keV region the dramatic increase in the penetration depth allows for both
bulk-sensitive and high- resolution measurements to be made. The strontium
doped La2NiO4 system is a prototypical system in the understanding of stron
g electron-phonon coupling, and the resultant effects on material propertie
s. At doping levels of 1/3 and (1)/(2) commensurate charge modulations are
observed indicating real-space charge stripes. We have measured the correla
tion lengths of these charge stripes using both 100 keV X-rays and 8.3 keV
X-rays. In comparing our results we have observed that the charge stripes a
ppear to be well correlated in the near-surface region with correlation len
gths xi approximate to 2400 Angstrom. However, our bulk sensitive measureme
nts show that the charge stripes appear in a possible stripe glass phase wi
th a correlation length of only xi approximate to 300 Angstrom. Our measure
ments on the 3D charge order manganite system Nd0.5Sr0.5MnO3 show that the
charge ordering appears to be well correlated in the bulk of the sample in
contrast to our nickelate results.