Texture effects caused by preferred orientation can be corrected in Rietvel
d analysis by an alternative algorithm presented in this contribution. This
algorithm is equivalent to models using symmetrized linear combinations of
spherical harmonic functions, but it is unique to all Laue classes and to
all orders. Positive definiteness of the polar-axis density is achieved by
the exponential method. The outlined algorithm was tested during Rietveld r
efinement of selected polycrystal samples. The algorithm was proven to be n
umerically robust and satisfactorily described deviations from the ideal in
tensity ratios of the Bragg reflections caused by the texture of the sample
s.