Optical characterization of metalorganic vapor-phase epitaxy-grown GaAs1-xNx alloys using spectroscopic ellipsometry

Citation
S. Matsumoto et al., Optical characterization of metalorganic vapor-phase epitaxy-grown GaAs1-xNx alloys using spectroscopic ellipsometry, J CRYST GR, 221, 2000, pp. 481-484
Citations number
12
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
221
Year of publication
2000
Pages
481 - 484
Database
ISI
SICI code
0022-0248(200012)221:<481:OCOMVE>2.0.ZU;2-K
Abstract
We have measured complex dielectric functions, epsilon (1) + i epsilon (2), of GaAs1-xNx alloys using spectroscopic ellipsometry to investigate higher -energy band gaps. The E-1 gap-related peak height for epsilon (2) decrease s with increasing N concentration, indicating that the optical absorption a t the E-1 gap decreases. On the contrary, the E-2 gap transition does not c hange so much with varying N concentration. These results are consistent wi th the theoretical study, which predicts that the lowest conduction band is mostly a combination of the Gamma and L states. The bowing parameters of t he E-1 and E-2 yaps are rather large but much smaller than the bowing param eter of the E-o gap. (C) 2000 Elsevier Science B.V. All rights reserved.