Rp. Pawlowski et al., Fundamental models of the metalorganic vapor-phase epitaxy of gallium nitride and their use in reactor design, J CRYST GR, 221, 2000, pp. 622-628
A fundamental reaction-transport model describing the metalorganic vapor-ph
ase epitaxy (MOVPE) of GaN from trimethyl-gallium (TMG) and ammonia has bee
n developed. This model has been tested against experimental data from rese
arch-scale and industrial-scale reactors. A simplified version of the model
that includes only transport phenomena and a unity sticking coefficient of
the limiting film precursor (TMG) to the surface of the growing film was f
ound to accurately capture observed film deposition variations in an early
variant of the Thomas Swan close-coupled-shower-head 3 x 2 " reactor. Modif
ications of the Thomas Swan reactor, in line with the findings suggested by
this work, enabled state-of-the-art thickness uniformity to be achieved. T
he model has been used to develop performance diagrams for conceptual multi
-aperture MOVPE reactors and for the Thomas Swan system. These performance
diagrams identify regions of the parameter space of the reactor which corre
spond to minimal variations in film growth rate across large-area substrate
s. Published by Elsevier Science B.V.