Characterization of tin oxide based sol-gel coatings on borosilicate glasses by X-ray reflectivity

Citation
Ap. Rizzato et al., Characterization of tin oxide based sol-gel coatings on borosilicate glasses by X-ray reflectivity, J SOL-GEL S, 19(1-3), 2000, pp. 811-816
Citations number
15
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
ISSN journal
09280707 → ACNP
Volume
19
Issue
1-3
Year of publication
2000
Pages
811 - 816
Database
ISI
SICI code
0928-0707(200012)19:1-3<811:COTOBS>2.0.ZU;2-H
Abstract
The X-ray reflectivity technique was applied in the study of tin oxide film s deposited by sol-gel dip-coating on borosilicate glasses. The influence o f the withdrawal speed and temperature of thermal treatment on the film str ucture was analyzed. We have compared the thermal evolution of the density and the shrinkage of the films with these properties measured for the monol ithic xerogel by helium picnometry and thermomechanical analysis. In agreem ent with the Landau-Levich model, the layer thickness increases by increasi ng the withdrawal speed. Nevertheless, it decreases with the increase of th e thermal treatment temperature, due to the densification process. The valu es of apparent density are smaller than the skeletal density, which shows t hat the films are porous. The comparison between the film and the monolith indicates that shrinkage during firing is anisotropic, occurring essentiall y perpendicular to the coating surface.