Q. Wei et al., Microstructural changes due to heat-treatment of annealing and their effect on the creep behavior of self-reinforced silicon nitride ceramics, MAT SCI E A, 299(1-2), 2001, pp. 141-151
In order to understand the improvement of creep resistance by furnace and m
icrowave annealing, we have investigated the effect of heat-treatment on th
e microstructural characteristics of the crept self-reinforced silicon nitr
ide (Si3N4) ceramic GS44. X-ray diffraction was performed on the as-sintere
d and heat-treated samples to study the phase changes due to annealing trea
tment. Optical microscopy and scanning electron microscopy (SEM) were used
to study the fracture surface and to identify the creep mechanism. High res
olution and analytical transmission electron microscopy (TEM) were employed
to analyze the microstructures of the crept samples with as-received and h
eat-treated conditions. It has been reported that both conventional furnace
and microwave annealing enhance the creep resistance of the material, and
microwave annealing had the most significant effect. Fractography showed th
at the microwave annealed samples exhibits least creep damage. Furnace anne
aling also reduces the creep damage, but the effect is far less as compared
to microwave annealing. Scanning electron microscopy (SEM) analysis showed
significant amount of multiple-junction cavitation in the creep-tested sam
ples. TEM observations showed significant devitrification of the amorphous
phases in the microwave annealed specimens, as verified by micro-diffractio
n studies of the junction phases. This is also confirmed by X-ray diffracti
on and high-resolution lattice image of the triple junction phases. The mic
rostructural observations were combined with a recent model of the effect o
f amorphous residues in ceramics on the creep behavior to explain the impro
vement in the creep resistance due to annealing. (C) 2001 Elsevier Science
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