We report on a novel solid-state spectrum analyzer in the near infrared. Th
e device is an array of six photodetectors based on polycrystalline germani
um film evaporated on a silicon substrate and each element is a wavelength-
selective detector. We describe the fabrication and characterization of suc
h device and we demonstrate its capability both as a wavelengthmeter for qu
asi-monochromatic light beams and as a spectrum analyzer. (C) 2001 Elsevier
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