Surface contouring by diffractive optical element-based fringe projection

Citation
G. Schirripa-spagnolo et D. Ambrosini, Surface contouring by diffractive optical element-based fringe projection, MEAS SCI T, 12(1), 2001, pp. N6-N8
Citations number
16
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences","Instrumentation & Measurement
Journal title
MEASUREMENT SCIENCE & TECHNOLOGY
ISSN journal
09570233 → ACNP
Volume
12
Issue
1
Year of publication
2001
Pages
N6 - N8
Database
ISI
SICI code
0957-0233(200101)12:1<N6:SCBDOE>2.0.ZU;2-0
Abstract
This design note describes an optoelectronic technique able to obtain the s urface topography. The sensor is based on a new fringe projection system, w hich uses a phase diffraction grating. The proposed system is simple, compa ct, robust and easy to use.