Electrophysical measurements for strongly aggressive liquid semiconductors

An original experimental technique for simultaneous electrical conductivity and thermo-e.m.f. measurements in a wide temperature range (up to 2000 K) under high pressures (up to 50 MPa) has been developed. Special ceramic mea suring cells were designed and constructed for investigation of chemically aggressive liquid semiconductors. Different sources of errors connected wit h convective flows, jamming signals, systematic deviation of measuring devi ces and especially diffusion of the liquid sample into the body of the cera mic are analysed and method of elimination are proposed. New results for so me liquid metal-chalcogen alloys in comparison with those obtained earlier illustrate advantages of the proposed method.