Iron-doped Sb2Te3 single crystals (C-Fe = (0-9.5) x 10(19) atoms/cm(-3)) we
re prepared from elements of semiconductor purity using a modified Bridgman
method. The samples of these crystals were characterized by means of X-ray
diffraction analysis, measurements of the reflectance in the plasma resona
nce frequency range omega (p), of the Hall constant R-H(B parallel to c) an
d electrical conductivity sigma (perpendicular toc). It was found that the
incorporation of Fe atoms into the Sb2Te3 crystal lattice reduces the volum
e of the unit cell; the values of omega (p) and RH(B parallel to c) (i.e. t
he concentration of holes) increase and the values of sigma (perpendicular
toc) decrease with increasing iron content. The observed increase in the ho
le concentration is explained as due to the incorporation of Fe atoms into
the Sb-sublattice creating thus substitutional defects of Fe'(Sb). The decr
ease in the electric conductivity is associated with a decrease in the hole
mobility.