ILGAR technology IV: ILGAR thin film technology extended to metal oxides

Citation
M. Bar et al., ILGAR technology IV: ILGAR thin film technology extended to metal oxides, SOL EN MAT, 67(1-4), 2001, pp. 113-120
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
SOLAR ENERGY MATERIALS AND SOLAR CELLS
ISSN journal
09270248 → ACNP
Volume
67
Issue
1-4
Year of publication
2001
Pages
113 - 120
Database
ISI
SICI code
0927-0248(200103)67:1-4<113:ITIITF>2.0.ZU;2-R
Abstract
An ion layer gas reaction (ILGAR) technique for the deposition of thin meta l oxide films such as zinc oxide has been developed. In a cyclic process a solid precursor layer was applied on a substrate by dipping in a Zn(ClO4)(2 ) solution and subsequent drying. Reaction with gaseous NH3/H2O led to a hy droxide layer which is thermally dehydrated to ZnO. The steps were repeated until the desired layer thickness was obtained. Under optimized conditions the chlorine remainder lay below 0.3 at%. X-ray-diffraction revealed a pre ferred orientation concerning the (002) plane. The band gap was determined to E-gap = 3.38 eV. First ZnO/CIGSSe solar cells showed efficiencies of 10. 7%. (C) 2001 Elsevier Science B.V. All rights reserved.