Monitoring of ion mass composition in plasma immersion ion implantation

Citation
Gh. Kim et al., Monitoring of ion mass composition in plasma immersion ion implantation, SURF COAT, 136(1-3), 2001, pp. 255-260
Citations number
13
Categorie Soggetti
Material Science & Engineering
Journal title
SURFACE & COATINGS TECHNOLOGY
ISSN journal
02578972 → ACNP
Volume
136
Issue
1-3
Year of publication
2001
Pages
255 - 260
Database
ISI
SICI code
0257-8972(20010202)136:1-3<255:MOIMCI>2.0.ZU;2-Y
Abstract
A system to monitor the ion mass and charge state as well as plasma potenti al value during plasma immersion ion implantation and deposition ((PID)-D-3 ) has been developed. It was tested with a 30-kV (PID)-D-3 setup using hot cathode DC (HC) and inductively coupled RF (ICP) discharge sources alternat ively. The ion mass analyzer has a moderate resolution at approximately 30, provides ion sampling from different points within the plasma volume, and is adaptable to various plasma devices. The design and performance of the s ystem will be described, and experimental results in nitrogen and argon pla smas produced by the modular HC-ICP source will be discussed. (C) 2001 Else vier Science B.V. All rights reserved.