Electron energy loss spectroscopy and annular dark field imaging at a nanometer resolution in a scanning transmission electron microscope

Authors
Stephan, O Gloter, A Imhoff, D Kociak, M Mory, C Suenaga, K Tence, M Colliex, C
Citation
O. Stephan et al., Electron energy loss spectroscopy and annular dark field imaging at a nanometer resolution in a scanning transmission electron microscope, SURF REV L, 7(4), 2000, pp. 475-494
Citations number
57
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SURFACE REVIEW AND LETTERS
ISSN journal
0218625X → ACNP
Volume
7
Issue
4
Year of publication
2000
Pages
475 - 494
Database
ISI
SICI code
0218-625X(200008)7:4<475:EELSAA>2.0.ZU;2-F
Abstract
The basics of electron energy loss spectroscopy (EELS) performed in the con text of a scanning transmission electron microscope are described. This inc ludes instrumentation, information contained in an EELS spectrum, data acqu isition and processing, and some illustrations by a few examples.