Cavity mode polarisation splitting in organic semiconductor microcavities

Citation
T. Virgili et al., Cavity mode polarisation splitting in organic semiconductor microcavities, SYNTH METAL, 116(1-3), 2001, pp. 497-500
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SYNTHETIC METALS
ISSN journal
03796779 → ACNP
Volume
116
Issue
1-3
Year of publication
2001
Pages
497 - 500
Database
ISI
SICI code
0379-6779(20010115)116:1-3<497:CMPSIO>2.0.ZU;2-1
Abstract
Angular-dependent reflectivity techniques are employed to probe the optical structure of microcavities containing a passive spacer layer, and also a f luorescent polymer. For the fluorescent polymer, we used the polymer poly(9 ,9-dioctylfluorene) (PFO), which was deposited between a dielectric and an aluminium mirror. The reflectivity spectra exhibit a strong polarisation de pendence with the cavity mode energy and photon linewidths of the cavity mo de different for the TE (transverse electric) and TM (transverse magnetic) polarisations. We find that as the cavity mode is moved away from the centr e of the dielectric mirror stop-band, the difference between the energy of the TE and TM modes grows. This results in a significant splitting of up to 110 meV between the TE and TM polarisations detected at large angle. We in vestigate this effect by varying the energy of the cavity mode with respect to the centre of the mirror stop-band. Results are analysed using a transf er-matrix model. Photoluminescence emission from the PFO containing microca vity was also measured. We find a splitting between TE and TM modes, which is also manifested in the photoluminescence (PL) emission. This allows cont rol of polarisation from an isotropic film, presenting a new method to cont rol exciton emission. (C) 2001 Elsevier Science B.V. All rights reserved.