A new high-brightness stepped-crystal diffractor for X-ray microanalysis

An electron-probe X-ray microanalyzers, the characteristic X-ray radiation is generated within a small volume of sample and the emitting surface area is on the order of 1 mum(2) . For a distance to analyzer of approximately 0 .5 m, this small emitting area can be considered as a point source. Practic al implementations of the electron-probe X-ray microanalysis (EPMA) require a high spectral resolution and sufficient intensity. The existing monochro mators cannot simultaneously provide for both. A prototype of the new high- brightness stepped-crystal diffractor for EPMA, based on four cylindrically bent (002) mica crystals, has been constructed and tested. (C) 2001 MAIK " Nauka/ Interperiodica".