Diamond films were synthesized by a microwave plasma-enhanced chemical vapo
r deposition method using H-2/CH4 gas mixtures. A Fluke PM6306 RCL Meter wa
s used to study the dielectric properties of the diamond films deposited. T
he dielectric dispersion measurement yielded the real and imaginary parts o
f impedance of diamond films in the form of a depressed semicircle in a com
plex plane. A Cole-Cole plot was observed at frequencies from 50 Hz to 1 MH
z. The result was found to fit the theoretical resistor-capacitor parallel
circuit model. The structure and quality of diamond films were analyzed by
scanning electron microscopy, X-ray diffraction and Raman spectroscopy. (C)
2001 Elsevier Science B.V. All rights reserved.