Gratings in indium oxide film overlayers on ion-exchanged waveguides by excimer laser micromachining

Citation
S. Pissadakis et al., Gratings in indium oxide film overlayers on ion-exchanged waveguides by excimer laser micromachining, APPL PHYS L, 78(6), 2001, pp. 694-696
Citations number
10
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
6
Year of publication
2001
Pages
694 - 696
Database
ISI
SICI code
0003-6951(20010205)78:6<694:GIIOFO>2.0.ZU;2-1
Abstract
Relief Bragg gratings were imprinted by 248 nm interferometric excimer lase r ablation on potassium ion-exchanged channel waveguides in BK-7 glass over laid with a thin high-index InOx film. Using five pulses of energy density 60 mJ/cm(2), a spectral transmittance notch of depth 66% and Delta lambda ( FWHM)<0.1 nm was obtained at 1547 nm in the TE polarization for a waveguide having a nominal width of 8 mum and a 135-nm-thick InOx overlayer. In wave guides coated with 100 nm InOx, with widths increasing from 3 to 8 mum, the reflection wavelength shifted by 0.12 nm/mum and the reflectivity increase d monotonically. (C) 2001 American Institute of Physics.