Improved performance of amorphous silicon thin film transistors by cyanidetreatment

Citation
Hn. Aiyer et al., Improved performance of amorphous silicon thin film transistors by cyanidetreatment, APPL PHYS L, 78(6), 2001, pp. 751-753
Citations number
22
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
6
Year of publication
2001
Pages
751 - 753
Database
ISI
SICI code
0003-6951(20010205)78:6<751:IPOAST>2.0.ZU;2-0
Abstract
We have examined the impact of a simple, wet chemical postgrowth treatment of "immersing in KCN solution" on the performance of inverted staggered amo rphous silicon n-channel thin film transistors. Results show that the cyani de treatment significantly improves the overall transistor performance by t he elimination of defect states. (C) 2001 American Institute of Physics.