Second-harmonic generation from silicon nanocrystals embedded in SiO2

Citation
Y. Jiang et al., Second-harmonic generation from silicon nanocrystals embedded in SiO2, APPL PHYS L, 78(6), 2001, pp. 766-768
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
78
Issue
6
Year of publication
2001
Pages
766 - 768
Database
ISI
SICI code
0003-6951(20010205)78:6<766:SGFSNE>2.0.ZU;2-E
Abstract
We present observations of optical second-harmonic generation (SHG) from si licon nanocrystals embedded in SiO2. SHG sensitivity to Si/SiO2 interface s tates, charge on the nanocrystals, and particle density gradients is demons trated. SHG is proven to be a powerful noncontact nondestructive diagnosis tool for characterization of Si-nanocrystal-based devices and materials. (C ) 2001 American Institute of Physics.