The recent development of CVD diamond windows for high power gyrotrons is s
ummarized. Highlights of this work include the manufacture of a window 100
mm in diameter and 1.6 mm thick having a uniform loss tangent of <1 x 10(-5
) at 145 GHz, and a window 120 mm in diameter and 2.25 mm thick with losses
below 3 x 10(-5) at 145 GHz. Moreover, the dielectric loss and permittivit
y have been found to be relatively stable over a wide temperature range fro
m 100 to 700 K compared to other materials such as sapphire or gold doped s
ilicon. More recently, development work has concentrated on achieving a rob
ust and cost effective manufacturing process able to produce windows matchi
ng the requirements of 1 MW CW gyrotrons for ECRH applications. Typical die
lectric properties for this new grade of material are presented using a 110
GHz gyrotron window 114 mm in diameter and 1.715 mm thick as an example. D
ata show a loss tangent in the region of 2 x 10(-5) at 145 GHz across the 8
0 mm clear aperture region of the disc. A numerical model is used to calcul
ate the temperature and stress profile of the window when subjected to high
power beam conditions. It is shown that these dielectric properties, in co
njunction with a thermal conductivity in the region of 2000 W m(-1)K(-1) at
room temperature and a fracture strength in excess of 250 MPa, make this g
rade of diamond suitable for use as an output window on 1 MW CW gyrotrons.
A new method of mounting CVD diamond windows to metal flanges has been deve
loped to allow vacuum bakeout to be performed at 550<degrees>C compared to
the previous limit of 450 degreesC. This increase in bakeout temperature pr
omises dramatic reductions in the time taken to achieve optimum vacuum cond
itions in the gyrotron. The new mounting utilizes a novel graded seal arran
gement to achieve low thermal mismatch stresses and good dimensional stabil
ity during thermal cycling. A 75 mm diameter window mounted using this meth
od has been shown to survive five thermal cycles up to 550 degreesC for 1 h
without degradation of its sealing performance. (C) 2001 Elsevier Science
B.V. All rights reserved.