Cj. Railton, The inclusion of fringing capacitance and inductance in FDTD for the robust accurate treatment of material discontinuities, IEEE MICR T, 48(12), 2000, pp. 2283-2288
Citations number
12
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
The analysis of structures, which contain sharp material discontinuities us
ing the finite-difference time-domain method (but without resorting to a ve
ry fine mesh) although much researched, has not yet been definitively solve
d. In this paper, the fringing fields associated with the discontinuities a
re dealt with by adjusting the permittivity and permeability assigned to th
e field nodes that are immediately adjacent to the discontinuities. This me
thod is shown to be effective for a variety of structures and to be without
the problems of violating energy or divergence conservation.