D. Heo et al., An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling, IEEE MICR T, 48(12), 2000, pp. 2361-2369
Citations number
24
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
An improved deep submicrometer (0.25 mum) MOSFET radio-frequency (RF) large
signal model that incorporates a new breakdown current model and drain-to-
substrate nonlinear coupling was developed and investigated using various e
xperiments. An accurate breakdown model is required for deep submicrometer
MOSFETs due to their relatively low breakdown voltage. For the first time,
this RF nonlinear model incorporates the breakdown voltage turnover trend i
nto a continuously differentiable channel current model and a new nonlinear
coupling circuit between the drain and the lossy substrate. The robustness
of the model is verified with measured pulsed I-V, S-parameters, power cha
racteristics, harmonic distortion, and intermodulation distortion levels at
different input and output termination conditions, operating biases, and f
requencies.