An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling

Citation
D. Heo et al., An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling, IEEE MICR T, 48(12), 2000, pp. 2361-2369
Citations number
24
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
48
Issue
12
Year of publication
2000
Pages
2361 - 2369
Database
ISI
SICI code
0018-9480(200012)48:12<2361:AIDSMR>2.0.ZU;2-P
Abstract
An improved deep submicrometer (0.25 mum) MOSFET radio-frequency (RF) large signal model that incorporates a new breakdown current model and drain-to- substrate nonlinear coupling was developed and investigated using various e xperiments. An accurate breakdown model is required for deep submicrometer MOSFETs due to their relatively low breakdown voltage. For the first time, this RF nonlinear model incorporates the breakdown voltage turnover trend i nto a continuously differentiable channel current model and a new nonlinear coupling circuit between the drain and the lossy substrate. The robustness of the model is verified with measured pulsed I-V, S-parameters, power cha racteristics, harmonic distortion, and intermodulation distortion levels at different input and output termination conditions, operating biases, and f requencies.