Linearity characteristics of GaAsHBTs and the influence of collector design

Citation
M. Iwamoto et al., Linearity characteristics of GaAsHBTs and the influence of collector design, IEEE MICR T, 48(12), 2000, pp. 2377-2388
Citations number
23
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
48
Issue
12
Year of publication
2000
Pages
2377 - 2388
Database
ISI
SICI code
0018-9480(200012)48:12<2377:LCOGAT>2.0.ZU;2-H
Abstract
Linearity characteristics of GaAs heterojunction bipolar transistors (HBTs) are studied through measurement and analysis. Third-order intermodulation distortion behavior of HBTs is examined on devices with various epilayer de signs and at various bias points, loads, and frequencies, Calculations from an analytical model reveal a strong bias and load dependence of third-orde r intercept point (IP3) on the nonlinearities from transconductance and the voltage dependence of base-collector capacitance. However, a simple model is not able to predict the fine details of IP3 with bias. A large-signal HB T model with an accurate description of the base-collector charge is shown to account for the measured trends. The base-collector charge function acco unts for the modulation of base-collector capacitance with current, electro n velocity modulation, and Kirk effect (base pushout) for GaAs-based HBTs, A detailed study of the influence of collector design on linearity is also presented.