Misfit strain induced lattice distortions in heteroepitaxially grown LaxCa1-xMnO3 thin films studied by extended x-ray absorption fine structure and high-resolution x-ray diffraction

Citation
A. Miniotas et al., Misfit strain induced lattice distortions in heteroepitaxially grown LaxCa1-xMnO3 thin films studied by extended x-ray absorption fine structure and high-resolution x-ray diffraction, J APPL PHYS, 89(4), 2001, pp. 2134-2137
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
4
Year of publication
2001
Pages
2134 - 2137
Database
ISI
SICI code
0021-8979(20010215)89:4<2134:MSILDI>2.0.ZU;2-J
Abstract
Mn-O and Mn-Mn interatomic distances were determined in LaxCa1-xMnO3 films grown heteroepitaxially on single crystal SrTiO3 and LaAlO3 substrates by m olecular beam epitaxy. Mn-O bond lengths were found to be fixed at similar to1.975 Angstrom for both types of substrates, while the Mn-Mn distance was detected to be larger for films grown on SrTiO3 substrates than for films grown on LaAlO3. The deviation of Mn-Mn interatomic distances, and subseque ntly Mn-O-Mn bond angles, in epitaxial LaxCa1-xMnO3 films is attributed to the misfit strain: compressive for LaAlO3 and tensile for SrTiO3 substrates . (C) 2001 American Institute of Physics.