Diffusion properties of Al in ZnTe substrates

Citation
M. Hanafusa et al., Diffusion properties of Al in ZnTe substrates, J APPL PHYS, 89(3), 2001, pp. 1989-1990
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
3
Year of publication
2001
Pages
1989 - 1990
Database
ISI
SICI code
0021-8979(20010201)89:3<1989:DPOAIZ>2.0.ZU;2-U
Abstract
In order to fabricate intrinsic pn junctions in p-type ZnTe substrates. for realizing pure-green light-emitting diodes, Al was used as the diffusion s pecies. We found that the Al diffusion region is observed as a dark region image by scanning electron microscopy. Al was diffused over a wide range of annealing temperatures and times. It was found that the activation energie s of Al diffusion into p-type ZnTe substrates were 1.9+/-0.1 eV and the dif fusion coefficient was given by D = 20 exp(-1.9/kT) cm(2)/s. (C) 2001 Ameri can Institute of Physics.