Crystallite shape ellipsoid in different varieties of silk fibers namely (i
) Chinese (ii) Indian, and (iii) Japanese, has been computed using wide-ang
le X-ray data and Hosemann's one-dimensional paracrystalline model. The est
imated microcrystalline parameters are correlated with the observed physica
l property of the silk fibers. (C) 2001 John Wiley & Sons, Inc.