E. Ikenaga et al., Study of ion desorption induced by carbon core excitation for poly-methylmethacrylate thin film using electron-ion coincidence spectroscopy, J CHEM PHYS, 114(6), 2001, pp. 2751-2759
We have developed a new electron-ion coincidence apparatus combined with sy
nchrotron radiation in order to examine the various ion desorption mechanis
ms related to the Auger process induced by core excitation. Photon stimulat
ed ion desorption (PSID) of a poly-methylmethacrylate (PMMA) thin film has
been investigated by this apparatus. The PSID of PMMA induced by carbon cor
e excitation has been examined using Auger electron yield, total ion yield,
resonant Auger electron, and Auger electron-photoion coincidence (AEPICO)
spectra. The spectrum of the total ion yield divided by the Auger electron
yield shows that the desorption efficiency is largely increased at the reso
nant excitation of carbon 1s electron in the O-CH3 side chain to sigma*(O-C
H3) orbital. In AEPICO measurement, H+ and CHn+ (n = 1-3) ions are observed
at various resonant excitations. The AEPICO signal intensity depends on th
e Auger electron energy. Particularly, the CH3+ ion desorption in coinciden
ce with Auger electron at 270 eV shows strong enhancement with sigma*(O-CH3
) resonant excitation. The results of the resonant Auger spectra and AEPICO
yield spectra demonstrate the relation of the ion desorption mechanism to
the bonding/antibonding character and localized character of the excited si
gma*(O-CH3) orbital and the Auger final state. (C) 2001 American Institute
of Physics.