Ab initio pseudopotential calculations have been carried out to determine t
he valence-band offset across the interface of FeSi2 grown on a silicon sub
strate. The structure of the beta -FeSi2[010]parallel to Si < 110 > matchin
g interface is also obtained. The lattice parameters of the beta -FeSi2 epi
layer defining the interfacial plane were constrained to those of silicon.
The valence-band offset was found to be about 0.39 eV with the Si side of t
he interface having the higher potential.