X-ray and neutron scattering study of Si-rich Si-Ge single crystals - art.no. 035204

Citation
D. Le Bolloc'H et al., X-ray and neutron scattering study of Si-rich Si-Ge single crystals - art.no. 035204, PHYS REV B, 6303(3), 2001, pp. 5204-NIL_199
Citations number
58
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
01631829 → ACNP
Volume
6303
Issue
3
Year of publication
2001
Pages
5204 - NIL_199
Database
ISI
SICI code
0163-1829(20010115)6303:3<5204:XANSSO>2.0.ZU;2-H
Abstract
The local atomic environments of homogeneous Si-rich Si-Ge single crystals were studied using x-ray and neutron diffuse scattering. No evidence of eit her chemical short-range order or clustering was observed. Static atomic di splacements, however, were clearly present and are consistent with an expan sion of the lattice in the vicinity of the Ge atoms. The dispersion of the acoustic phonons was also measured using inelastic neutron scattering. The acoustic modes of the Si-Ge alloy were found to lie nearer those of pure Si than expected from the homologous relationship found between pure Si and p ure Ge.