A fast-scanning, low- and variable-temperature scanning tunneling microscope

The design and performance of a fast-scanning, low- and variable-temperatur e, scanning tunneling microscope (STM) incorporated in an ultrahigh vacuum system is described. The sample temperature can be varied from 25 to 350 K by cooling the sample using a continuous flow He cryostat and counter heati ng by a W filament. The sample temperature can be changed tens of degrees o n a time scale of minutes, and scanning is possible within minutes after a temperature change. By means of a software implemented active drift compens ation the drift rate can be as low as 1 nm/day. The STM is rigid, very comp act, and of low weight, and is attached firmly to the sample holder using a bayonet-type socket. Atomic resolution on clean metal surfaces can be achi eved in the entire temperature range. The performance of the instrument is further demonstrated by images of adsorbed hexa-tert-butyl-decacyclene mole cules on Cu(110), by STM movies, i.e., sequential STM images with a time re solution down to 1 s/image (100x100 Angstrom (2) with 256x256 pixels), of t he mobility of these molecules, and finally by constant current images of s tanding waves in the electronic local density of states on Cu(110). (C) 200 1 American Institute of Physics.