A silicon quantum wire transistor, in which electrons are transported throu
gh a very narrow wire, has been fabricated using silicon-on-insulator techn
ology, electron beam lithography, anisotropic dry etching, and thermal oxid
ation. We have obtained the quantum wire with a width of 65 nm, which is fu
lly embedded in silicon dioxide. This narrow dimension of the wire and larg
e potential barrier between silicon and silicon dioxide make the electrons
moving through the wire experience one-dimensional confinement. The step-li
ke structure in the conductance versus gate voltage curve, which is a typic
al evidence of one-dimensional conductance. has been observed at temperatur
es below 4.2 K. A period of step appearance and a step size have been analy
zed to compare experimental characteristics with theoretical calculation. (
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