Amplitude, deformation and phase shift in amplitude modulation atomic force microscopy: a numerical study for compliant materials

Citation
A. San Paulo et R. Garcia, Amplitude, deformation and phase shift in amplitude modulation atomic force microscopy: a numerical study for compliant materials, SURF SCI, 471(1-3), 2001, pp. 71-79
Citations number
32
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
SURFACE SCIENCE
ISSN journal
00396028 → ACNP
Volume
471
Issue
1-3
Year of publication
2001
Pages
71 - 79
Database
ISI
SICI code
0039-6028(20010110)471:1-3<71:ADAPSI>2.0.ZU;2-F
Abstract
Numerical simulations were applied to investigate the motion of a tip inter acting with a compliant sample. The dependence of the amplitude, deformatio n, contact time and phase shift on the mechanical properties of the sample, free oscillation amplitude and cantilever force constant were investigated . The compliance and surface adhesion energy favour the formation of an adh esion neck between tip and surface. The neck modifies the tip motion when i ts length is comparable to the free oscillation amplitude. The simulations also show that the tip may oscillate fully indented on the sample if large force constant cantilevers and amplitudes are used. A good compromise betwe en stability and resolution is achieved by using low force constant cantile vers and large oscillation amplitudes. The agreement obtained between theor y and experimental data supports the conclusions of the model. (C) 2001 Els evier Science B.V. All rights reserved.