The nature of the nucleation centers formed during the so-called bias enhan
cement nucleation (BEN) of chemical vapor deposited diamond is still an ope
n question. We address this problem by studying a long time nucleation proc
ess and its impact upon the nucleation density and quality of grown films d
eposited on Si substrates by hot filament chemical vapor deposition (HF CVD
) method. It was found that the nucleation density of the growth centers on
silicon wafers increased drastically with the increasing process time up t
o a few hours.