Surface residence time measurements of transient methyl radicals

Citation
Ka. Briggman et al., Surface residence time measurements of transient methyl radicals, CHEM P LETT, 334(1-3), 2001, pp. 1-6
Citations number
13
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CHEMICAL PHYSICS LETTERS
ISSN journal
00092614 → ACNP
Volume
334
Issue
1-3
Year of publication
2001
Pages
1 - 6
Database
ISI
SICI code
0009-2614(20010202)334:1-3<1:SRTMOT>2.0.ZU;2-E
Abstract
We present the first measurement of the thermal desorption kinetics of meth yl radicals. Neutral methyl radicals are photochemically produced within a methyl iodide film condensed on MgO(100). A substantial fraction become tra pped through inelastic collisions with the film and thermalize to the film temperature prior to desorption. Novel residence time measurements are made by comparing neutral and ion flight times in a time-of-flight spectrometer , tin Arrhenius analysis of methyl radical residence times provides a desor ption barrier of 2.5 +/- 0.5 kcal mol(-1) and a pre-factor of 10(10+/-1) s( -1). (C) 2001 Elsevier Science B.V. All rights reserved.