X-ray photoelectron spectroscopy study of the metal/cermet interface

Citation
H. Lu et al., X-ray photoelectron spectroscopy study of the metal/cermet interface, CHIN PHYS L, 18(1), 2001, pp. 94-96
Citations number
11
Categorie Soggetti
Physics
Journal title
CHINESE PHYSICS LETTERS
ISSN journal
0256307X → ACNP
Volume
18
Issue
1
Year of publication
2001
Pages
94 - 96
Database
ISI
SICI code
0256-307X(2001)18:1<94:XPSSOT>2.0.ZU;2-F
Abstract
Interfacial reactions between aluminium and polycrystalline cermet TiC0.6 w ere investigated using x-ray photoelectron spectroscopy, Auger electron spe ctroscopy and x-ray diffraction. It was found that titanium exists in two c hemical states. The carbide and oxide of titanium can be detected simultane ously, and the atomic ratio of Ti:C:O is 5:3:2. This suggests that TiC0.6 i s a Ti-oxycarbide or oxygenated TiC composite: Ti5C3O2 (TiO2 + 4TiC(0.75)) When Al is deposited in vacuum on the Ti-oxycarbide surface, the active Al atoms react chemically only with TiO2 at room temperature, but not with Tic (0.75) in Ti-oxycarbide. The reaction products are Al2O3 and the intermetal lic compound Al-3 Ti. Annealing the Al/TiC0.6 interface at 750 degrees C, A l reacts also with TiC0.75 to form a brittle Al4C3 phase.