Bandgap tuning of the InGaAsP/InP multiple quant um well (MQW) laser struct
ure by the impurity-free vacancy diffusion (IFVD) is investigated using pho
toluminescence. It has been demonstrated that the effects of the plasma bom
bardment to the:sample surface involved in the IFVD technique can enhance t
he intermixing of the InGaAsP/InP MQW laser structure. The reliability of t
he IFVD technique, particularly the effects of the surface decomposition an
d the intrinsic defects formed in the growth or preparation of the wafer, h
as been discussed.