Defect-oriented testing and defective-part-level prediction

Authors
Dworak, J Wicker, JD Lee, S Grimaila, MR Mercer, MR Butler, KM Stewart, B Wang, LC
Citation
J. Dworak et al., Defect-oriented testing and defective-part-level prediction, IEEE DES T, 18(1), 2001, pp. 31-41
Citations number
10
Categorie Soggetti
Computer Science & Engineering
Journal title
IEEE DESIGN & TEST OF COMPUTERS
ISSN journal
07407475 → ACNP
Volume
18
Issue
1
Year of publication
2001
Pages
31 - 41
Database
ISI
SICI code
0740-7475(200101/02)18:1<31:DTADP>2.0.ZU;2-A
Abstract
A defective-part-level model combined with a method for choosing test patte rns that use site observation can predict defect levels in submicron ICs mo re accurately than simple stuck-at fault analysis.