Ray tracing analysis of large-scale random rough surface scattering and delay spread

Citation
Ky. Yoon et al., Ray tracing analysis of large-scale random rough surface scattering and delay spread, IEICE TR EL, E84C(2), 2001, pp. 267-270
Citations number
6
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEICE TRANSACTIONS ON ELECTRONICS
ISSN journal
09168524 → ACNP
Volume
E84C
Issue
2
Year of publication
2001
Pages
267 - 270
Database
ISI
SICI code
0916-8524(200102)E84C:2<267:RTAOLR>2.0.ZU;2-C
Abstract
We have discussed a ray tracing method to estimate the scattering character istics from random rough surface. It has been shown from the traced rays th at the diffracted rays dominate over the reflected rays. For the field eval uation, we have used the Fresnel function for the diffracted coefficient an d the Fresnel's reflection coefficients. Numerical examples have been carri ed out for the scattering characteristics of an ocean wave-like rough surfa ce and the delay spared characteristics of a building-like surface. In the present work we have demonstrated that the ray tracing method is effective to numerical analysis of a rough surface scattering.