Impedance of barrier-type oxide layer on aluminum

Citation
Hj. Oh et al., Impedance of barrier-type oxide layer on aluminum, JPN J A P 1, 39(12A), 2000, pp. 6690-6695
Citations number
20
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Volume
39
Issue
12A
Year of publication
2000
Pages
6690 - 6695
Database
ISI
SICI code
Abstract
The impedance characteristics of barrier-type oxide layers on aluminum was studied using impedance spectroscopy. Since anodic films on Al have a varia ble stoichiometry with a gradual reduction of oxygen deficiency towards the oxide-electrolyte interface, the interpretation of impedance spectra for o xide layers is complex and the impedance of surface layers differs from tho se of ideal capacitors. This frequency response of the layer with conductan ce gradients cannot be described by a single resistance-capacitance (RC) el ement. The oxide layers of Al are properly described by the Young model of dielectric constant with a vertical decay of conductivity.