Spectrally resolved photoconductivity (PC) of p-type porous silicon (P
S) samples was measured using a transparent liquid contact which ideal
ly fills the pores. Lock-in detection of the photocurrent allows one t
o separate the substrate and the porous layer signals by detecting pha
se changes during the wavelength scan. The in-phase signal component w
ith the substrate response characterizes the transmission of porous si
licon, while the out-of-phase component is related to the actual PC of
the PS film. (C) 1997 Elsevier Science S.A.