BRILLOUIN-SCATTERING OF POROUS SILICON

Authors
BEGHI MG BOTTANI CE GHISLOTTI G AMATO G BOARINO L
Citation
Mg. Beghi et al., BRILLOUIN-SCATTERING OF POROUS SILICON, Thin solid films, 297(1-2), 1997, pp. 110-113
Citations number
7
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
Thin solid films → ACNP
ISSN journal
00406090
Volume
297
Issue
1-2
Year of publication
1997
Pages
110 - 113
Database
ISI
SICI code
0040-6090(1997)297:1-2<110:BOPS>2.0.ZU;2-L
Abstract
Low and high porosity porous silicon samples with different microstruc tures were studied for the first time by Brillouin light scattering. T he surface and bulk acoustic phonon spectrum was measured and the phys ical properties of a subsurface region 1 mu m thick, about which littl e is known, were explored. (C) 1997 Elsevier Science S.A.