V. Grivickas et al., RELEVANCE OF THE CARRIER TRANSPORT CHANGE IN POROUS SILICON AT THE ONSET OF ONE EXCITED PAIR PER CRYSTALLITE, Thin solid films, 297(1-2), 1997, pp. 125-128
We report on the first experimental observation of transient free-carr
ier absorption-detected gratings in highly-luminescent porous silicon
membranes. The sloping changes on 400 mu s long decay scale are observ
ed below the injection onset for one excited electron-hole pair per na
nocrystallite which are related to a notable shortening in the microse
cond recombination form. A preliminary microscopic model for the dispe
rsive recombination is suggested including the photoinduced fraction o
f uncorrelated carriers, which recombine according to a power decay, i
n contrast to the excitons which recombine according to a stretched ex
ponential. At low excitation, we extract the upper limit of exciton di
ffusion coefficient and diffusion length as D = 3.4 X 10(-5) cm(2) s(-
1) and L = 315 nm. (C) 1997 Elsevier Science S.A.