Mg. Berger et al., DIELECTRIC FILTERS MADE OF PS - ADVANCED PERFORMANCE BY OXIDATION ANDNEW LAYER STRUCTURES, Thin solid films, 297(1-2), 1997, pp. 237-240
For the formation of PS dielectric filters a detailed calibration of t
he etch rates and refractive indices is required. The effective dielec
tric function of PS was determined for different substrate doping leve
ls as a function of the anodization current density by fitting reflect
ance spectra. Based on these results a number of different dielectric
filters were realized. For device applications a thermal oxidation ste
p is necessary to reduce aging effects which occur as a result of the
native oxidation of PS. In addition, thermal oxidation results in a qu
alitatively improve filter performance due to a reduced absorption in
the PS layers. Therefore the dielectric functions of PS oxidized in dr
y O-2 at temperatures up to 950 degrees C were determined. A continuou
s variation of the porosity and hence the refractive index with depth
was used to realize so-called rugate filters. This type of interferenc
e filter allows the design of structures with more complex reflectance
or transmittance characteristics than structures consisting of discre
te single layers. (C) 1997 Elsevier Science S.A.