A test device to implement room temperature visible light emitting dio
des (LED) based on porous silicon (p-Si) is reported. The device is ob
tained through a post processing electrochemical anodization of p-type
doped Si wafers where n(+)-type stripes have been obtained by implant
ation. This device differs with respect to others by the fact that the
n(+)-type stripes are not floating on p-Si but are joined to the unde
rlying p-type doped silicon by narrow crystalline stems which provide
mechanical stability to the device and act as a thermal sink during di
ode operation. A detailed characterization of the LED and comparison w
ith a control LED (i.e. without the n(+)-type stripes) were carried ou
t. A model of electrical injection, which aims to explain the electrol
uminescence results and the observed differences between the proposed
LED structure and the control LED, is also proposed. (C) 1997 Elsevier
Science S.A.