IMAGING OF SURFACE-POTENTIAL DISTRIBUTION IN CYANINE DYE MONOLAYER BYSCANNING MAXWELL STRESS MICROSCOPY (SMM)

Citation
Y. Hirata et al., IMAGING OF SURFACE-POTENTIAL DISTRIBUTION IN CYANINE DYE MONOLAYER BYSCANNING MAXWELL STRESS MICROSCOPY (SMM), Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals, 294, 1997, pp. 55
Citations number
5
Categorie Soggetti
Crystallography
ISSN journal
1058725X
Volume
294
Year of publication
1997
Database
ISI
SICI code
1058-725X(1997)294:<55:IOSDIC>2.0.ZU;2-J
Abstract
Scanning Maxwell stress Microscopy (SMM), which is a type of scanning probe microscopy designed to image microscopic electrical properties, has been applied to cyanine dye Langmuir-Blodgett (LB) monolayers. In combination of epifluorescence microscope technique with SMM, the cyan ine J-aggregate formation way was clearly observed. Further the light induced electron transfer between cyanine and viologen in LB film syst em could be detected as a surface potential change by SMM technique.