Rs. Jeng et al., The use of 16S and 16S-23S rDNA to easily detect and differentiate common Gram-negative orchard epiphytes, J MICROB M, 44(1), 2001, pp. 69-77
The identification of Gram-negative pathogenic and non-pathogenic bacteria
commonly isolated from an orchard phylloplane may result in a time consumin
g and tedious process for the plant pathologist. The paper provides a simpl
e "one-step" protocol that uses the polymerase chain reaction (PCR) to ampl
ify intergenic spacer regions between 16S and 23S genes and a portion of 16
S gene in the prokaryotic rRNA genetic loci. Amplified 16S rDNA, and restri
ction fragment length polymorphisms (RFLP) following EcoRI digestion produc
ed band patterns that readily distinguished between the plant pathogen Erwi
nia amylovora (causal agent of fire blight in pear and apple) and the orcha
rd epiphyte Pantoea agglomerans (formerly E. herbicola). The amplified DNA
patterns of 16S-23S spacer regions may be used to differentiate E. amylovor
a at the intraspecies level. Isolates of E. amylovora obtained from raspber
ries exhibited two major fragments while those obtained from apples showed
three distinct amplified DNA bands. In addition, the size of the 16S-23S sp
acer region differs between Pseudomonas syringae and Pseudomonas fluorescen
s. The RFLP pattern generated by HaeIII digestion may be used to provide a
rapid and accurate identification of these two common orchard epiphytes. (C
) 2001 Published by Elsevier Science B.V.