Nonlinear characterization of ultrathin polymer layers by means of surfaceplasmon resonance

Authors
Giorgetti, E Margheri, G Gelli, F Sottini, S
Citation
E. Giorgetti et al., Nonlinear characterization of ultrathin polymer layers by means of surfaceplasmon resonance, LASER PHYS, 11(1), 2001, pp. 120-125
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
LASER PHYSICS
ISSN journal
1054660X → ACNP
Volume
11
Issue
1
Year of publication
2001
Pages
120 - 125
Database
ISI
SICI code
1054-660X(200101)11:1<120:NCOUPL>2.0.ZU;2-5
Abstract
The use of Surface Plasmon Resonance as a powerful tool for the nonlinear c haracterization of ultrathin dielectric layers is proposed and experimental ly demonstrated. The off-resonant chi ((3)) of thin films (10-50 nm) of the soluble polycarbazolyldiacetylene PDCHD-HS deposited on silver was measure d at 1064 nm and with picosecond pulses: all samples exhibited a negative a nd real chi ((3)) of the order of 10(-17) m(2)/V-2.